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Facts
- The CDE Resmap 4 point resistivity mapper is used for measuring resistivity across the wafer for substrates and thin films.
- The system can do automated resistivity mapping for pieces to 8 inch wafers.
Personnel
- Process Engineer - Sean O'Brien
- Super User - Patricia Meller
Manuals & Users
Overview
Content Tools
Please go to our SMFL Main Website
for information about